Approximate strain coefficients of metallic films deduced from an effective Fuchs-Sondheimer conduction model and from an effective relaxation time method-Reference-Cited by-同舟云学术

Approximate strain coefficients of metallic films deduced from an effective Fuchs-Sondheimer conduction model and from an effective relaxation time method

Published:1979-02 Issue:1 Volume:57 Page:163-168
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Tellier C.R.,Tosser A.J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

2. The mean free path of electrons in metals

3. Grain Size Dependence of the Gauge Factor of Thin Metallic Films

4. Exact and approximate expressions for the temperature coefficient of resistivity of polycrystalline films using the Mayadas-Shatzkes model

5. The Mayadas-Shatzkes conduction model treated as a Fuchs-Sondheimer model

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