An investigation of the relations between the technological parameters, phase constitution and electrical characteristics of thick Pd-Ag resistive films-Reference-Cited by-同舟云学术

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An investigation of the relations between the technological parameters, phase constitution and electrical characteristics of thick Pd-Ag resistive films

Published:1973-09 Issue:3 Volume:17 Page:345-361
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Kusy Andrzej

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Precision glaze resistors;Hoffman;Ceramic Bull.,1963

2. Reliability characteristics of palladium-silver thick film resistors;Headly,1968

3. Thick film hybrid microelectronic circuit technology;Ilgenfritz;SCP and Solid State Technology,1966

4. Stability of palladium oxide glaze resistors;Melan;Microelectronics and Reliability,1967

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Silver-Palladium Thick-Film Conductors;Journal of the American Ceramic Society;1994-12

2. Correlation of Subsolidus Phase Relations in the AgPdO System to Oxidation Reduction Kinetics and Dilametric Behavior;Journal of the American Ceramic Society;1992-08

3. Thermodynamic Modeling of Equilibrium Subsolidus Phase Relations in the Ag-Pd-O2 System;Journal of the American Ceramic Society;1991-06

4. Palladium and Oxygen;Pd Palladium;1989

5. Subsolidus Phase Relations in the System Pd-Ag-O and Application to Multilayer Ceramic Capacitor Electrodes;Advanced Ceramic Materials;1988-09

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