Capacitance-voltage and surface photovoltage measurements of pyrolytically deposited SiO2 on InP
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Surface characterisation of indium phosphide
2. InP/SiO2MIS structure
3. An InP MIS diode
4. The Mos/InP interface
5. InP-Langmuir-film m.i.s. structures
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