Thin film microanalysis using laser ablation and laser ionization mass spectrometry-Reference-Cited by-同舟云学术

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Thin film microanalysis using laser ablation and laser ionization mass spectrometry

Published:1987-11 Issue:1-2 Volume:154 Page:1-10
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Odom R.W.,Schueler B.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Kinetics of ion formation from salts by pulsed-laser irradiation

2. Advances in Atomic and Molecular Physics;Morellec,1982

3. Surface analysis by nonresonant multiphoton ionization of desorbed or sputtered species

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