Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera-Reference-Cited by-同舟云学术

Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera

Published:1990-09 Issue:2 Volume:190 Page:317-323
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Sasanuma Yuji,Kitano Yukishige,Ishitani Akira

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Polymerized monomolecular layers: A new class of ultrathin resins for microlithography

2. Rapid writing of fine lines in Langmuir-Blodgett films using electron beams

3. An applied science perspective of Langmuir-Blodgett films

4. Superlattice and Negative Differential Conductivity in Semiconductors

5. Direct Observation of Superlattice Formation in a Semiconductor Heterostructure

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1. First observation of in-plane X-ray diffraction arising from a single layered inorganic compound film by a grazing incidence X-ray diffraction system with a conventional laboratory X-ray source;Chemical Physics Letters;2002-01

2. A control system for Langmuir-Blodgett film deposition set-up based on microstepping;Measurement Science and Technology;1998-03-01

3. Characterization of long-periodic layered structures by X-ray diffraction Part VI: electron density distribution and chain orientation in a Langmuir—Blodgett film of cadmium stearate;Thin Solid Films;1995-06

4. Thermal Relaxation Process of Stearate LB Films Sandwiched by Chromophoric Polymer LB Layers Studied by the Energy Transfer Method and Transmission Electron Microscopy;Langmuir;1994-11

5. Characterization of long-periodic layered structures by X-ray diffraction V: small angle X-ray scattering of distorted multilayers;Thin Solid Films;1994-07