Hydrogenated amorphous silicon films deposited by reactive sputtering: The electronic properties, hydrogen bonding and microstructure-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Hydrogenated amorphous silicon films deposited by reactive sputtering: The electronic properties, hydrogen bonding and microstructure

Published:1989-04 Issue:1 Volume:171 Page:217-233
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Pinarbasi M.,Maley N.,Myers A.,Abelson J.R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. The Physics of Hydrogenated Amorphous Silicon I;Knights,1984

2. Amorphous Metals and Semiconductors;Thornton,1986

3. Neutral radical deposition from silane discharges

4. Hydrogen in amorphous semiconductors

Cited by 98 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Role of Hydrogen in the Preparation of Amorphous Silicon Nanowires by Metal-Assisted Chemical Etching;The Journal of Physical Chemistry C;2018-09-07

2. Tunable, omnidirectional structural color on reflection based on metal-SiOx-metal structure;Applied Physics Letters;2016-12-12

3. Amorphous Silicon and Germanium;Reference Module in Materials Science and Materials Engineering;2016

4. Direct Imaging of Two-State Dynamics on the Amorphous Silicon Surface;Physical Review Letters;2011-06-10

5. Crystallization of as-deposited amorphous silicon films on glass prepared by magnetron sputtering with different substrate biases and temperatures;Journal of Crystal Growth;2011-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP