Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
8 articles.
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1. References;Thin Films by Chemical Vapour Deposition;1990
2. A new method for the complete optical analysis of weakly absorbing thin films: Application to polycrystalline silicon films;Thin Solid Films;1985-05
3. Bibliography;Thermophysical Properties Research Literature Retrieval Guides;1982
4. Bibliography;Thermophysical Properties Research Literature Retrieval Guide 1900–1980;1982
5. Polycrystalline silicon film thickness measurement from analysis of visible reflectance spectra;Journal of the Optical Society of America;1979-08-01