Author:
Cairns J.A.,Marwick A.D.,Mitchell I.V.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
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1. Trace Analysis by Heavy Ion Induced X-Ray Emission;Microchimica Acta;2000-06-19
2. A comparative study of methods for thin-film and surface analysis;Reports on Progress in Physics;1984-03-01
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