Ion scattering spectrometry below 10 keV-Reference-Cited by-同舟云学术

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Ion scattering spectrometry below 10 keV

Published:1973-12 Issue:1 Volume:19 Page:43-56
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Hong Richard E.,Harrington William L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference62 articles.

1. Scattering of keV ions from solid surfaces;Smith,1967

2. Scattering of low-energy noble gas ions from metal surfaces;Smith;J. Appl. Phys.,1967

3. Tabulation of atomic scattering parameters calculated classically from a screened Coulomb potential;Bingham;Sandia Research Rept. SC-RR-66-506, TID-4500-Physics,1966

4. Ion scattering spectrometry—a new technique for surface composition analysis;Goff,1971

5. Ion scattering spectrometry;Goff;J. Vac. Sci. Technol.,1973

Cited by 68 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of low energy ion scattering to oxidic surfaces;Materials Science Monographs;1995

2. Ion Scattering Spectroscopy;Catalyst Characterization;1994

3. Interaction of Low-Energy Ions, Atoms and Molecules with Surfaces;Interaction of Charged Particles with Solids and Surfaces;1991

4. Surface and depth analysis based on sputtering;Topics in Applied Physics;1991

5. References;Thin Films by Chemical Vapour Deposition;1990

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