Method for determining the refractive index and thickness of a non-absorbing thin film with randomly rough boundaries
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. VI Methods for Determining Optical Parameters of Thin Films
2. Measurement and Preparation of Thin Films in Optics;Vašiček,1957
3. Reflection of Light by a System of Nonabsorbing Isotropic Film–Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy;Journal of Optics;2021-09-07
2. IV: Scattering of Light from Multilayer Systems With Rough Boundaries;Progress in Optics;1995
3. Determination of optical constants: the plane–parallel slab;Applied Optics;1980-02-15
4. The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry;Thin Solid Films;1979-02
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