On the segregation of the conductive phase in RuO2-based thick resistive films-Reference-Cited by-同舟云学术

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On the segregation of the conductive phase in RuO2-based thick resistive films

Published:1984-11 Issue:4 Volume:121 Page:263-270
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Szpytma Andrzej,Kusy Andrzej

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Struktura, mechanizm przewodnictwa oraz szumy typu 1/ƒ rezystywnych warstw grubych;Kusy,1979

2. Conduction mechanisms in thick film microcircuits;Vest,1975

3. Particle size effects in thick film resistors;Carcia;J. Appl. Phys.,1982

4. Percolation and conductivity: a computer study, I;Pike;Phys. Rev. B,1974

5. Wpływ rozmiarów krystalitów proszków Pd i Ag na strukturȩ i parametry elektryczne rezystywnych warstw grubych;Wrona,1979

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1. Effect of RuO₂ crystallinity and particle size on electrical property of LTCC resistors;International Journal of Modern Physics B;2022-05-07

2. Tunneling-percolation origin of nonuniversality: Theory and experiments;Physical Review B;2005-02-16

3. Critical behaviour of the piezoresistive response in RuO2–glass composites;Journal of Physics D: Applied Physics;2003-05-15

4. Anisotropic random resistor networks: A model for piezoresistive response of thick-film resistors;Journal of Applied Physics;2002-08-15

5. Classical percolation threshold and resistance versus temperature behaviour of RuO2-glass films;Physica B: Condensed Matter;1997-09

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