The determination of lattice parameters and strains in stressed thin films using X-ray diffraction with Seeman-Bohlin focusing
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Physics of Nonmetallic Thin Films;Hoffman,1976
2. Intrinsic Stress in Evaporated Metal Films
3. Mechanical Properties of Thin Films on Substrates
4. Residual strains of Pb thin films deposited onto Si substrates
5. The Measurement of Residual Stresses by X-Ray Diffraction Techniques
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