Determination of the absorption coefficient of a real semiconductor film: Application to ZnSe
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Relation Between Surface Roughness and Specular Reflectance at Normal Incidence
2. Relation between the Height Distribution of a Rough Surface and the Reflectance at Normal Incidence
3. The effects of sample imperfections on optical spectra
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