Characterization of the dielectric properties of thin films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Non-exponential decay in dielectrics and dynamics of correlated systems
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1. Dielectric studies on Cd0.4Zn0.6Te thin films;Materials Chemistry and Physics;2003-02
2. SiOxNy Films deposited with SiCl4 by remote plasma enhanced CVD;Journal of Materials Science;1999
3. Low-frequency divergence of the dielectric constant in metal-insulator nanocomposites with tunneling;Physical Review B;1998-11-15
4. Characterization of SiOxNy films deposited from SiCI4 by remote plasma-enhanced chemical vapor deposition;Thin Solid Films;1998-04
5. On temperature dependence of conductivity and thermopower of co-sputtered Nix-(SiO2)1-x composite thin films;Sensors and Actuators A: Physical;1997-07
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