Analyse de multicouches W/C par spectroscopie d'électrons Auger
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
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1. Hydrodesulfurization of tetrahydrothiophene over evaporated Mo, Co and Mo-Co model catalysts;Catalysis Letters;1999
2. Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy;Surface Science Reports;1989-11
3. Characterization of X-UV multilayers by grazing incidence X-ray reflectometry;Revue de Physique Appliquée;1988
4. AES sputtering depth profile analysis of C/W layered synthetic microstructures;Applied Surface Science;1987-04
5. Sputtering techniques applied to realization of ultrathin layered stacks (of the order of nanometres): in situ ellipsometry control system;Thin Solid Films;1986-07
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