Numerical aspects of the implementation of effective-medium approximation models in spectroscopic ellipsometry regression software-Reference-Cited by-同舟云学术

Numerical aspects of the implementation of effective-medium approximation models in spectroscopic ellipsometry regression software

Published:1993-10 Issue:1-2 Volume:234 Page:423-427
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Rouseel Ph.J.,Vanhellemont J.,Maes H.E.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference3 articles.

1. Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen;Bruggeman;Ann. Phys.,1935

2. Characterization by spectroscopic ellipsometry of buried layer structures in silicon formed by ion beam synthesis;Vanhellemont;Mater. Sci. Eng. B,1992

3. under “Cardano formula”,1988

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