Extension of spectroscopic ellipsometry to the far infrared-Reference-Cited by-同舟云学术

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Extension of spectroscopic ellipsometry to the far infrared

Published:1993-10 Issue:1-2 Volume:234 Page:346-351
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Dittmar G.,Offermann V.,Pohlen M.,Grosse P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Freie Elektronen in Festkörpern;Grosse,1979

2. Ellipsometry and Polarized Light;Azzam,1977

3. Optics;Hecht,1974

4. Infrared Spectroscopic Ellipsometry;Röseler,1990

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical arrangement and proof of concept prototype for mid infrared variable angle spectroscopic ellipsometry;Infrared Physics & Technology;2012-01

2. Characterisation of epitaxial layers on silicon by spectroscopic ellipsometry;Materials Science and Engineering: B;2000-04

3. Spectroscopic Ellipsometry in the Mid Infrared with a New Accessory Fitting into Standard Fourier-transform Spectrometers;Progress in Fourier Transform Spectroscopy;1997

4. Spektroskopische Infrarotellipsometrie;Analytiker-Taschenbuch;1996

5. Mueller matrix analysis of infrared ellipsometry;Applied Optics;1994-09-01

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