Rapid generation of functional tests using MSCs, SDL and TTCN-Reference-Cited by-同舟云学术

Rapid generation of functional tests using MSCs, SDL and TTCN

Published:2001-02 Issue:3-4 Volume:24 Page:374-393
ISSN:0140-3664
Container-title:Computer Communications
language:en
Short-container-title:Computer Communications

Author:

Probert R.L,Ural H,Williams A.W

Publisher

Elsevier BV

Subject

Computer Networks and Communications

Reference21 articles.

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4. Telelogic Tau tool set, version 3.3, Telelogic AB, Malmo Sweden.

5. L. Doldi, V. Encontre, J.-C. Fernandez, T. Jéron, S. Le Bricquer, N. Texier, M. Phalippou, Assessment of automatic generation methods of conformance test suites in an industrial context, Proceedings of the Ninth International Workshop on the Testing of Communicating Systems (IWTCS ‘96), Darmstadt Germany, Chapman and Hall, London, 1996, pp. 347–361.

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