Towards the enhancement of medical imaging with non-destructive testing (NDT) CMOS sensors. Evaluation following IEC 62220-1-1:2015 international standard-Reference-Cited by-同舟云学术

Towards the enhancement of medical imaging with non-destructive testing (NDT) CMOS sensors. Evaluation following IEC 62220-1-1:2015 international standard

Published:2018 Issue: Volume:10 Page:326-332
ISSN:2452-3216
Container-title:Procedia Structural Integrity
language:en
Short-container-title:Procedia Structural Integrity

Author:

Martini N.,Koukou V.,Fountos G.,Valais I.,Bakas A.,Ninos K.,Kandarakis I.,Panayiotakis G.,Michail Ch.

Publisher

Elsevier BV

Subject

General Engineering,Energy Engineering and Power Technology

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