Adaptive convolution confidence sieve learning for surface defect detection under process uncertainty-Reference-Cited by-同舟云学术

Adaptive convolution confidence sieve learning for surface defect detection under process uncertainty

Published:2023-09 Issue: Volume:640 Page:119014
ISSN:0020-0255
Container-title:Information Sciences
language:en
Short-container-title:Information Sciences

Author:

Lei Lei^ORCID,Li Han-Xiong,Yang Hai-Dong

Publisher

Elsevier BV

Subject

Artificial Intelligence,Information Systems and Management,Computer Science Applications,Theoretical Computer Science,Control and Systems Engineering,Software

Reference48 articles.

1. A distributed principal component regression method for quality-related fault detection and diagnosis;Sun;Inf. Sci.,2022

2. Multiscale convolution based probabilistic classification for detecting bare PCB defects;Lei;IEEE Trans. Instrum. Meas.,2022

3. Triplet-graph reasoning network for few-shot metal generic surface defect segmentation;Bao;IEEE Trans. Instrum. Meas.,2021

4. Uncertainty of key performance indicators for industry 4.0: a methodology based on the theory of belief functions;Souifi;Comput. Ind.,2022

5. Rsmote: a self-adaptive robust smote for imbalanced problems with label noise;Chen;Inf. Sci.,2021

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