Subject
Artificial Intelligence,Information Systems and Management,Computer Science Applications,Theoretical Computer Science,Control and Systems Engineering,Software
Reference41 articles.
1. Fault detection in wireless sensor networks through SVM classifier;Zidi;IEEE Sensors Journal,2018
2. Machine-learning approach in detection and classification for defects in TSV-based 3-D IC;Huang;IEEE Transactions on Components, Packaging and Manufacturing Technology,2018
3. Detection of power grid disturbances and cyber-attacks based on machine learning;Defu Wang;Journal of Information Security and Applications,2019
4. Deep-structured machine learning model for the recognition of mixed-defect patterns in semiconductor fabrication processes;Lee;IEEE Transactions on Semiconductor Manufacturing,2018
5. D.-W. Jang, S. Lee, J.-W. Park, D.-C. Baek, Failure detection technique under random fatigue loading by machine learning and dual sensing on symmetric structure, International Journal of Fatigue 114 (December 2017) (2018) 57–64, doi: 10.1016/j.ijfatigue.2018.05.004.
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