The application of secondary ion emission to impurity control in tokamaks
Author:
Publisher
Elsevier BV
Subject
Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics
Reference37 articles.
1. Proc. 2nd ANS Topical Mtg. on the Technology of Controlled Nuclear Fusion;Stacey,1976
2. Determination of ion fraction and energy analysis of sputtered particles from deuterium bombarded surfaces
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