Depth profile analyses of implanted deuterium in tungsten by secondary ion mass spectrometry-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Depth profile analyses of implanted deuterium in tungsten by secondary ion mass spectrometry

Published:1995-04 Issue: Volume:220-222 Page:800-804
ISSN:0022-3115
Container-title:Journal of Nuclear Materials
language:en
Short-container-title:Journal of Nuclear Materials

Author:

Tokunaga K.,Takayama M.,Muroga T.,Yoshida N.

Publisher

Elsevier BV

Subject

Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics

Reference9 articles.

1. Physics of Plasma-Wall Interactions in controlled Fusion;Moller,1986

2. Secondary Ion Mass Spectrometry;Benninghoven,1987

3. Proc. 8th Symp. on ISIAT '84;Ozawa,1984

4. Depth profiling of hydrogen by detection of recoiled protons

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Studies on the near-surface trapping of deuterium in implantation experiments;Nuclear Fusion;2021-01-22

2. Improvement of quantitative analysis of molybdenum element using PLS-based approaches for laser-induced breakdown spectroscopy in various pressure environments;Plasma Science and Technology;2019-01-17

3. Modeling and Simulation of Hydrogen Behavior in Tungsten;ACTA METALL SIN;2018

4. Surface Topography and Deuterium Retention of Polycrystalline Tungsten and Nanocrystalline Tungsten Film Exposed to Deuterium Plasma;Fusion Science and Technology;2017-10-19

5. High hydrogen retention in the sub-surfaces of tungsten plasma facing materials: A theoretical insight;Scripta Materialia;2016-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP