Composition analysis of tin/lead platings on printed circuit boards by the beta-backscatter method

Author:

Damkjaer Anders

Publisher

Elsevier BV

Subject

Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Radiation

Reference6 articles.

1. QRM-17-E, Qualification Test specification for two-sided printed circuit boards;European Space Research and Technology Centre. Product Assurance Division,1974

2. Back Scattering of Electrons

3. Thickness Measurement of Gold Deposits

4. Range-Energy Relations for Electrons and the Determination of Beta-Ray End-Point Energies by Absorption

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