A new LFSR based high-frequency test method for RSFQ circuit

Author:

Chen Liyun,Li Songrui,Ying Liliang,Niu Minghui,Liu Huanli,Zhang Hui,Zhang Xue,Gao Xiaoping,Ren Jie,Peng WeiORCID,Wang Zhen

Publisher

Elsevier BV

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Built-In Self-Test of SFQ Circuits Using Side-Channel Leakage Information;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06

2. Test Performance Analysis of Rapid Single Flux Quantum Circuits With Auxiliary Circuits;IEEE Transactions on Applied Superconductivity;2024-06

3. Self-Feedback Test Vector Generation Based on Weighted Matching Method;2024 9th International Conference on Electronic Technology and Information Science (ICETIS);2024-05-17

4. Super-Tsetlin: Superconducting Tsetlin Machines;IEEE Transactions on Applied Superconductivity;2024-05

5. Demonstration and Comparison of On-Chip High-Frequency Test Methods for RSFQ Circuits;IEEE Transactions on Applied Superconductivity;2023-08

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