X-ray diffraction from rough, relaxed and reconstructed surfaces-Reference-Cited by-同舟云学术

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X-ray diffraction from rough, relaxed and reconstructed surfaces

Published:1989-03 Issue:3 Volume:210 Page:301-321
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Vlieg E.,Van Der Veen J.F.,Gurman S.J.,Norris C.,Macdonald J.E.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference22 articles.

1. Defects at semiconductor surfaces

2. Quantitative analysis of streaks in reflection high-energy electron diffraction: GaAs and AlAs deposited on GaAs(001)

3. Proceedings of the Nato Workshop on RHEED;Lagally,1987

4. Surface X-Ray Scattering during Crystal Growth: Ge on Ge(111)

5. Diffraction from stepped surfaces

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