Electron mobility in a semiconductor inversion layer
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference8 articles.
1. Electrons and “SURFONS” in a semiconductor inversion layer
2. Measurement of Elastic Constants at Low Temperatures by Means of Ultrasonic Waves–Data for Silicon and Germanium Single Crystals, and for Fused Silica
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4. Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit
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3. Simulation of Silicon Devices: An Overview;Advanced Physical Models for Silicon Device Simulation;1998
4. Spectral Function Analysis of Fermi Liquids and of Composite Fermions in A Finite Magnetic Field: Renormalised Gaps;International Journal of Modern Physics B;1997-05-20
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