Field electron and field ion imaging of silicon surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
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Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Fabrication of a sharp Si protrusion with a faceted apex grown from a surface-melted silicon wafer under high electric and magnetic fields: application to field emission electron sources;Japanese Journal of Applied Physics;2024-06-03
2. Atomic force microscope tip sharpening and evaluation by electric field confinement using a metal grid close to the tip;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2000
3. The equilibrium shape of silicon;Surface Science;1995-06
4. Field-ion microscopy of the si(001) surface;Philosophical Magazine A;1992-09
5. A Use of Specimens in Form of Tips for In-Situ Experiments in Electron Microscopes (Preparations, Preliminary Results);MRS Proceedings;1990
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