Electron energy-loss spectroscopy of Ni2Si: Valence collective excitation and structural properties-Reference-Cited by-同舟云学术

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Electron energy-loss spectroscopy of Ni2Si: Valence collective excitation and structural properties

Published:1986-03 Issue:1-3 Volume:168 Page:204-211
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Betti M.G.,Rinaldi C.,Sassaroli P.,Sorba L.,Nannarone S.,de Crescenzi M.,del Pennino U.,Mariani C.,Valeri S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference25 articles.

1. Reliability and Degradation;Ottaviani,1981

2. Microscopic properties and behavior of silicide interfaces

3. Els investigation of the Si-Pd interface

4. X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides

5. Reflection electron-energy-loss investigation of the electronic and structural properties of palladium

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Core level electron energy loss study of the PD-SI(111)2 × 1 Interface Formation;Il Nuovo Cimento D;1991-02

2. Extended energy loss fine structure analysis;Critical Reviews in Solid State and Materials Sciences;1989-01

3. Empty states investigation of Ni2Si by photon absorption spectroscopy;Physica Scripta;1987-07-01

4. Two hole spectra and valence states in chromium and chromium silicides;Journal of Electron Spectroscopy and Related Phenomena;1987-01

5. Electron energy loss spectroscopic investigation of Cr-L2,3 core levels in Cr and chromium silicides;Solid State Communications;1987-01

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