Optical reflectance as a tool for bulk and adsorbate studies: Application to variously treated Si(111) surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference49 articles.
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5. The Optical Properties of Solids;Bassani,1966
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1. Reflection;Optical Diagnostics for Thin Film Processing;1996
2. Analysis of the XPS and optical reflectivity spectra of the chemically etched Si(111) surfaces;Journal of Electron Spectroscopy and Related Phenomena;1995-12
3. Optical characterisation of semiconductor surfaces and interfaces;Progress in Surface Science;1995-05
4. X-Ray Photoelectron Spectroscopy and Optical Reflectivity Studies of Si Surfaces Prepared by Chemical Etching;Acta Physica Polonica A;1994-11
5. Ultraviolet Reflectivity of TlSbS2;Crystal Research and Technology;1993
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