A model calculation of the auger depth profile at a sharp interface of two homogeneous substances and its comparison with the experimental depth profile of an aluminium oxide — aluminium interface-Reference-Cited by-同舟云学术

A model calculation of the auger depth profile at a sharp interface of two homogeneous substances and its comparison with the experimental depth profile of an aluminium oxide — aluminium interface

Published:1984-03 Issue:1 Volume:138 Page:172-180
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Bas E.B.,Pan X.P.,Rüegg K.J.,Stucki F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference4 articles.

1. F. Stucki, R. Seiler and E.B. Bas, A New Auger Spectrometer with Cylindrical Mirror Analyser and Hybrid Electron Ion Gun for Precise Depth Profiling, to be published.

2. 5th Intern. Conf. on Solid Surfaces;Pan,1983

3. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

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