Atom probe characterization of isotropic spinodal decompositions: spatial convolutions and related bias
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference6 articles.
1. Materials analysis with a position-sensitive atom probe
2. SOME ASPECTS OF THE MEASUREMENT OF COMPOSITION IN THE ATOM PROBE
3. STATISTICAL ANALYSIS OF ATOM-PROBE DATA (I) : DERIVATION OF SOME FINE-SCALE FEATURES FROM FREQUENCY DISTRIBUTIONS FOR FINELY DISPERSED SYSTEMS
4. STATISTICAL ANALYSIS OF ATOM-PROBE DATA (II) : THEORETICAL FREQUENCY DISTRIBUTIONS FOR PERIODIC FLUCTUATIONS AND SOME APPLICATIONS
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