Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
45 articles.
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1. Multiscale Modeling in Chemical Vapor Deposition Processes: Models and Methodologies;Archives of Computational Methods in Engineering;2020-01-21
2. Mie-Scattering Ellipsometry;Ellipsometry - Principles and Techniques for Materials Characterization;2017-11-29
3. Introduction to Optical Characterization of Materials;Practical Materials Characterization;2014
4. Ellipsometers;digital Encyclopedia of Applied Physics;2003-04-15
5. A square law for the analysis of real time ellipsometric nucleation and growth data;Thin Solid Films;1998-02