What determines the probing depth of electron yield XAS?-Reference-Cited by-同舟云学术

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What determines the probing depth of electron yield XAS?

Published:1995-02 Issue:2-3 Volume:324 Page:L371-L377
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Schroeder S.L.M.,Moggridge G.D.,Ormerod R.M.,Rayment T.,Lambert R.M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference32 articles.

1. High‐pass photocathode x‐ray ionization chamber for surface EXAFS

2. Photoemission and Absorption Spectroscopy of Solids and Interfaces with Synchrotron radiation;Lengeler,1990

3. Electron Yield XAFS Study of Evaporated Co/Pd Multilayers with Various Thickness Ratios of Co to Pd Sublayers: Simulations of the Co K-edge XAFS and Fourier Transforms

4. Magnetic and structural characteristics of epitaxial FexCo1−xalloy films on ZnSe(001)

5. Surface-extended x-ray-absorption fine-structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity

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