Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference28 articles.
1. Proc. First Int. Conf. on Scanning Tunneling Microscopy,1987
2. Proc. Second Int. Conf. on Scanning Tunneling Microscopy;J. Vac. Sci. Technol. A,1988
3. The effects of self‐ion bombardment (30–500 keV) on the surface topography of single‐crystal germanium
4. Summary Abstract: Surface morphology of oxidized and ion-etched silicon by scanning tunneling microscopy
5. Surface morphology of oxidized and ion‐etched silicon by scanning tunneling microscopy
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