An STM study of current-induced step bunching on Si(111)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference38 articles.
1. Electromigration in metals
2. The influence of an electric potential gradient on the thermal etching of silver
3. Electromigration on semiconductor surfaces
4. Initial stages of silicon homoepitaxy studied by in situ reflection electron microscopy
5. Transformations on clean Si(111) stepped surface during sublimation
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