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An integrated approach to adsorbate structure determination using photoelectron diffraction: direct “imaging” and quantitative simulation

  • Published:1996-06 Issue: Volume:357-358 Page:19-27
  • ISSN:0039-6028
  • Container-title:Surface Science
  • language:en
  • Short-container-title:Surface Science

Author:

Woodruff D.P.,Davis R.,Booth N.A.,Bradshaw A.M.,Hirschmugl C.J.,Schindler K.-M.,Schaff O.,Fernandez V.,Theobald A.,Hofmann Ph.,Fritzsche V.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference53 articles.

1. Low Energy Electron Diffraction;Van Hove,1986

2. LEED and DLEED as modern tools for quantitative surface structure determination

3. Adsorbate structure determination on surfaces using photoelectron diffraction

4. Applications of Synchrotron Radiation: High-resolution Studies of Molecules and Molecular Adsorbates on Surfaces;Bradshaw,1995

5. X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography

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