Author:
Allié G.,Blanc E.,Dufayard D.,Haymann P.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
5 articles.
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1. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
2. Preparation of atomically clean surfaces of selected elements: A review;Applications of Surface Science;1982-01
3. Electronics structures of Rb, Cs and some of their metallic oxides studied by photoelectron spectroscopy;Chemical Physics;1979-10
4. Auger electron spectroscopy;Ultraviolet Photoelectron and Photoion Spectroscopy Auger Electron Spectroscopy Plasma Excitation in Spectrochemical Analysis;1979
5. Experimental study of surface and bulk plasmon losses induced in Al(001) by low energy electrons;Surface Science;1977-01