The structure of the surface determined using X-ray diffraction-Reference-Cited by-同舟云学术

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The structure of the surface determined using X-ray diffraction

Published:1989-05 Issue:3 Volume:215 Page:555-565
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Conway K.M.,Macdonald J.E.,Norris C.,Vlieg E.,van der Veen J.F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference21 articles.

1. Study of the Si(111)-Ga surface by X-ray photoelectron and auger electron diffraction

2. Unoccupied surface states revealing the Si(111)√3 √3-Al, -Ga, and -In adatom geometries

3. Adsorbate registry and subsurface relaxation of the reconstructions

4. Ge(111) : The atomic geometry

5. Geometric structure of the Si(111)√3×√3-Ga surface

Cited by 54 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural transitions on Si(1 1 1) surface during Sn adsorption, electromigration, and desorption studied by in situ UHV REM;Applied Surface Science;2023-01

2. Superconductivity in a Hole-Doped Mott-Insulating Triangular Adatom Layer on a Silicon Surface;Physical Review Letters;2020-09-09

3. Atomic and electronic structure of doped Si(111)(23×23)R30∘ -Sn interfaces;Physical Review B;2018-05-01

4. Magnetic order in a frustrated two-dimensional atom lattice at a semiconductor surface;Nature Communications;2013-03-27

5. X-ray standing wave analysis of theSn∕Si(111)−√3×√3surface;Physical Review B;2004-12-15

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