Spot profile analysis (LEED) of defects at silicon surfaces-Reference-Cited by-同舟云学术

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Spot profile analysis (LEED) of defects at silicon surfaces

Published:1983-09 Issue:1-3 Volume:132 Page:82-91
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Henzler M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference18 articles.

1. LEED studies of surface imperfections

2. The present status of low-energy electron diffraction

3. Surface Crystallogrphy by LEED;Van Hove,1979

4. Low Energy Electron Diffraction;Pendry,1974

5. Electron Spectroscopy for Surface Analysis;Henzler,1977

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