Surface properties of Si from photoelectric emission at room temperature and 80 °K
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference17 articles.
1. Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon
2. Direct and Indirect Excitation Processes in Photoelectric Emission from Silicon
3. Proc. Intern. Colloquim on Optical Properties and Electronic Structure of Metals and Alloys;Gobeli,1965
4. Photo-emission from semiconductor surfaces
5. Photoelectric Emission from InAs: Surface Properties and Interband Transitions
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effective Work Functions of the Elements;Progress in Surface Science;2021-12
2. A quantitative model for doping contrast in the scanning electron microscope using calculated potential distributions and Monte Carlo simulations;Journal of Applied Physics;2011-01
3. Photoelectron Emission Technique for the Surface Analysis of Silicon Wafer Covered with Oxide Film;MRS Proceedings;2005
4. Chapter 3 NEA Semiconductor Photoemitters;Semiconductors and Semimetals;1981
5. VI Photoemission;Progress in Optics;1977
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3