Configurational resonances in optical near-field microscopy: a rigorous point-dipole approach
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference22 articles.
1. Analyticity of the angular spectrum amplitude of scattered fields and some of its consequences
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4. New form of scanning optical microscopy
5. External and internal reflection near field microscopy: experiments and results
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