Concentration depth profiles by XPS; A new approach
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference17 articles.
1. Quantitative depth profiling in surface analysis: A review
2. The quantitative analysis of surfaces by XPS: A review
3. Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPS
4. Methods of Surface Analysis;Wehner,1975
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