Author:
Salvan F.,Fuchs H.,Baratoff A.,Binnig G.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference17 articles.
1. Scanning tunneling microscopy
2. G. Binnig and H. Rohrer, in: Proc. 17th Intern. Conf. on the Physics of Semiconductors, in press.
3. Summary Abstract: Scanning tunneling microscopy of semiconductor surfaces
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