Surface model for field emission processes-Reference-Cited by-同舟云学术

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Surface model for field emission processes

Published:1983-11 Issue:1 Volume:134 Page:272-282
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Bono S.,Good R.H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference10 articles.

1. Field Emission and Field Ionization;Gomer,1961

2. Field Ion Microscopy, Principles and Applications;Müller,1969

3. Field ion microscopy, field ionization and field evaporation

4. 19th Field Emission Symp.;Müller,1972

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1. The Heisenberg’s Uncertainty Principle (HUP) and the Electron Statistics (ES) in Heavily Doped (HD) Kane-type III-V and Opto-Electronic Materials in the Presence of Intense Radiation;Heisenberg’s Uncertainty Principle and the Electron Statistics in Quantized Structures;2022

2. Study on the local barrier field variations for electron tunneling in field ionization at a step edge of W(112) with a micro-probe hole field ion microscope;Japanese Journal of Applied Physics;2020-01-01

3. Preface;Nanomaterials;2018-11-05

4. 1. Heisenberg’s uncertainty principle (HUP) and the carrier contribution to the elastic constants in heavily doped (HD) optoelectronic nanomaterials in the presence of intense light waves;Nanomaterials;2018-11-05

5. Few Related Applications;Springer Tracts in Modern Physics;2015-10-27

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