Internal field emission of microelectronic MIS structures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference9 articles.
1. Characteristics of the insulator-semiconductor (IS) systems with a graded-bandgap insulator at high electric fields
2. Properties of MNOS structures
3. Physical Base of MIS;Litovchenko,1979
4. Structure and Properties of Si-SiO2 Systems;Vertoprakhov,1981
5. Generation of positive charge in silicon dioxide during avalanche and tunnel electron injection
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