Author:
Wagner R.J.,Kennedy T.A.,Wieder H.H.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Bruchmechanik in der Schadensanalyse;Systematische Beurteilung technischer Schadensfälle;2014-04-11
2. Properties of InAs/InAlAs heterostructures;Semiconductor Science and Technology;2001-07-19
3. Ballistic-electron-emission microscopy onAu−GaAsSchottky diodes using InAs tips;Physical Review B;1998-04-15
4. Ballistic electron emission microscopy using InAs tips;Applied Physics A: Materials Science & Processing;1998-03-01
5. III-V Inversion-Layer Transport;Physics and Chemistry of III-V Compound Semiconductor Interfaces;1985