Electron scattering in silicon inversion layers by oxide and surface roughness
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference14 articles.
1. Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance
2. P. Kwok, private communication, 1966.
3. On the role of scattering by surface roughness in silicon inversion layers
4. Proc. 2nd Intern. Conf. on Solid Surfaces;Matsumoto,1974
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