The analysis of surface processes on solid electrons by combined modulated ellipsometric and reflectometric experiments
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference18 articles.
1. Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements
2. The monitoring of fast changes in the optical properties of electrode surfaces with a classical ellipsometer
3. Modulation ellipsometry and its application to the study of the electrode-electrolyte interface
4. Differential reflection spectroscopy of very thin surface films
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ellipsometric observation of the adsorption of sodium dodecyl sulfate;Langmuir;1988-01
2. Ellipsometric measurements of the Pt-aqueous electrolyte interface, in the absence and in the presence of specific anionic adsorption;Journal of Electroanalytical Chemistry and Interfacial Electrochemistry;1985-05
3. Classified Bibliography of Electroanalytical Applications;Comprehensive Treatise of Electrochemistry;1984
4. In situ ellipsometric study of successive anodization of monolayers in some layered semiconductors;Surface Science;1980-06
5. Ellipsometric study of the polymeric surface films formed on platinum electrodes by the electrooxidation of phenolic compounds;Surface Science;1980-06
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