Author:
Groeneveld R.H.M.,Prins M.W.J.,van Kempen H.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference9 articles.
1. Photoamperic probes in scanning tunneling microscopy
2. Optical near‐field imaging with a semiconductor probe tip
3. M.W.J. Prins, M.C.M.M. van der Wielen, D.L. Abraham, H. van Kempen and H.W. van Kesteren, IEEE Trans. Magn., accepted for publication.
4. Near‐field magneto‐optical imaging in scanning tunneling microscopy
5. Physics of Semiconductor Devices;Sze,1981
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